Measurement & Metrology

Built for precision applications, Oxxius lasers provide stable, low-noise light sources optimized for measurement and metrology. Their power stability, wavelength accuracy, and excellent beam quality make them ideal for calibration, optical sensing, interferometry, and high-resolution inspection.

Whether you’re developing an OEM system or upgrading a lab setup, Oxxius laser technology helps ensure repeatable measurements and confident results. From industrial quality control to scientific metrology, Oxxius delivers consistent performance for accurate and traceable data.

Brillouin Spectroscopy

Brillouin spectroscopy uses laser light to quantify the mechanical properties of a medium. Oxxius lasers make this delicate measurement possible….

Filtered Rayleigh Scattering (FRS)

Filtered Rayleigh Scattering (FRS) is a technique used to remotely measure the thermodynamic properties of a gas flow, particularly in situations where seeding is not feasible. Oxxius lasers provide t…

Dynamic Light Scattering

Dynamic Light Scattering (DLS) is a technique used to measure the size of small particles suspended in a liquid. Oxxius lasers provide the stable, low-noise illumination required to perform these meas…

Laser Doppler Velocimetry (LDV)

Filtered Rayleigh Scattering (FRS) is a technique used to remotely measure the thermodynamic properties of a gas flow, particularly in situations where seeding is not feasible. Oxxius lasers provide t…

Raman Spectroscopy

Filtered Rayleigh Scattering (FRS) is a technique used to remotely measure the thermodynamic properties of a gas flow, particularly in situations where seeding is not feasible. Oxxius lasers provide t…

Semiconductor analysis

To ensure the quality of semiconductor materials, it is essential to characterize them at multiple stages of fabrication and detect defects as early as possible. Spectroscopic photoluminescence and Ra…

Shearography

To ensure the quality of semiconductor materials, it is essential to characterize them at multiple stages of fabrication and detect defects as early as possible. Spectroscopic photoluminescence and Ra…

Surface Profiling

To ensure the quality of semiconductor materials, it is essential to characterize them at multiple stages of fabrication and detect defLaser-based profiling measures and maps height variations of just…